Ahrensburg / Budapest, July 07, 2010– Basler AG, one of the leading companies in the Vision Technology sector worldwide, and Semilab Zrt, a leading Supplier for Photo-Voltaic Metrology and Inspection, are pleased to announce, that they have closed the
Semilab signed a frame agreement with IMEC, the world’s leading independent research institute in the field of micro- and nanoelectronics. This is to facilitate joint development projects (JDPs) related to semiconductor metrology.
BUDAPEST, Hungary. - September 29, 2008 - Semilab Co. Ltd., and SOPRA SA., both leading manufacturers of materials metrology solutions to the semiconductor and solar industries, today announced that Semilab Co. Ltd. has acquired the assets of SOPRA SA. The deal is for an undisclosed cash amount, and the transaction was closed on the 17th September, 2008.
Semilab Co. Ltd., a leading supplier of non-contact wafer mapping metrology solutions for the semiconductor and solar cell industries, announced today that it has licensed key patents and transferred relevant know-how from Applied Materials, Inc. The acquired intellectual property (IP) covers technology and systems used in semiconductor applications for measuring implant and metal thickness.
Semilab announced that it had licensed key patents and transferred technology and know-how related to implant monitoring and metal layer characterization from Applied Materials, Inc. The acquired IP covers systems which are capable of junction depth and implant dose measurements, and determination of metal thickness, via and interconnect resistance on product wafers.
BUDAPEST, Hungary. March 8th, 2008 - Semilab Co. Ltd., and SSM Inc., both leading manufacturers of materials metrology solutions to the semiconductor and solar industries, today announced Semilab Co. Ltd. has acquired SSM Inc. as previously reported.
