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Semilab, as the world’s major metrology tool provider for the solar production market, is proudly announcing the sponsorship agreement signed with the E-MRS 2014 Spring Meeting organizers. Semilab will sponsor the Meeting as well as dedicatedly its Symposium Y: „Advanced materials and characterization techniques for solar cells II”.
Dr. Tibor Pavelka, President and CEO of Semilab, was awarded the Gábor Dénes Prize for his outstanding contribution to the development of metrology and process control equipment used in the semiconductor and photovoltaic industries. The Prize is also a recognition of his leading role in building a successful company in the high-tech industry in Hungary.
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Semilab, a leading supplier of epitaxial layer characterization products announces the next generation of its well-known and widely used automatic Spreading Resistance Profiler (SRP) system. The new SRP-2100 will replace SRP-2000 from Q1, 2014. The SRP-2100 system offers wider measurement range, improved precision and repeatability, smaller footprint, and a new software with easy-to-use interface. For further information, contact your local Semilab office.
GLOBALFOUNDRIES U.S. Inc. and Semilab are to present a joint research talk during the AVS 60th International Symposium & Exhibition on 31 October, 2013, about recent results obtained with Semilab’s novel ellipsometer porosimeter PS-2000 being capable of extracting thermal expansion coefficients of thin ULK coatings. The abstract of the talk is available in the conference abstract booklet on page 203, and can also be read below.