Metrology

Ellipsometry is an optical method for accurate measurement of the thickness and optical functions of thin film coatings and novel...
PhotoConductivity is a well known effect that one can use to measure minority carrier parameters. In this technique a microwave...
Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures....
Instrumentation
Deep Level Transient Spectroscopy is a powerful technology for the study of electrically active defects (known as traps) in...
Instrumentation
An external light illuminating the semiconductor induces a change in its surface potential. Surface Photovoltage (SPV) is the  overall...
Instrumentation
Infrared based methods measures the scattering, transmission and reflection of the infrared light. Thanks to this inpurities,...
Instrumentation
Efficiency of a complete solar cell is determined by measuring current induced by light.
Instrumentation