Spectroscopic Ellipsometry
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SEMILAB SOPRA Products are based on more than 30 years of optical expertise in spectrometers and spectrographs.
SEMILAB SOPRA offers a large family of Table Top and Framed Spectroscopic Ellipsometer to support Research and Development work on Thin Film characterization and Material Science.
The wavelength coverage of SEMILAB SOPRA Spectroscopic Ellipsometers is continuously expanding, from Far UV (135nm) to Far Infra-Red (33µm) with high resolution and/or fast measurement modes.
Spectroscopic Ellipsometers are proposed from manual to fully automated configuration with automatic sample loading from cassettes (SE5).
Moreover, SEMILAB SOPRA offers the possibility to combine several techniques like GXR, FTIR, Porosimetry onto the same R&D Ellipsometer to achieve more accurate diagnostics on complex structures. In this way more applications can be covered, supporting SEMILAB SOPRA’s leading position in the R&D field with more than 600 instruments installed worldwide.
