Home
  • Home
  • Products
  • News
  • Events
  • Literature
  • Projects
  • About us
  • Contact

Epi Layer Resistivity

Printer-friendly versionPrinter-friendly version

Epimet measures CV curves from a 5 µm distance.

Products: 
ACV-3000

Epi Layer Resistivity

  • ACV-3000

Deep Level Transient Spectroscopy

  • DLS-1000
  • DLS-83D
  • ECV-3000
  • FAaST 300-SL
  • FAaST COCOS / MC
  • FAaST Near Surface Doping
  • FAaST PDM
  • FAaST SASS I-V
  • FAaST SDI C-V
  • MCV-2500 / MCV-530
  • PMR-3000
  • QC-2500e

SPV Diffusion Length

  • FAaST SPV
  • WT-2000
  • WT-2500
  • WT-3000

Spectroscopic Ellipsometry

  • GES5E
  • SE-3000

Model-based infrared technology

  • IR-3100

Bulk Micro Defects

  • LST-300A
  • SIRM-300

Ellipsometry Porosimetry

  • PS Series

SurfaceWave™

  • SW-3300

JPV

  • WT-2000
  • WT-2500
  • WT-3000

UVPCD Epi-lifetime

  • WT-2000
  • WT-2500
  • WT-3000

VQ oxide monitoring

  • WT-2000
  • WT-2500
  • WT-3000

µ-PCD Lifetime

  • WT-2000
  • WT-2000MCT
  • WT-2500
  • WT-3000

Copyright © 2009 Semilab Co. Ltd.