WT-2000MCT
Printer-friendly version
Temperature Dependent Lifetime Measurements
Temperature Dependent Lifetime Measurements for Characterization of Narro Band Semiconductors
The WT-2000MCT is a special design for µ-PCD lifetime measurement at different sample temperatures.
Operating modes:
- Whole wafer mapping at a preselected stabilized temperature
- Single-point lifetime scan as a function of temperature
APPLICATIONS
- Minority carrier lifetime as a function of temperature
- Excels in measuring lifetime in narrow band semiconductors, where excess carriers are thermally excited at room temperature
- Materials: HgCdTe, InSb, GaAs, etc.
Temperature range: from 80K to 325K
Applications:
Technologies:
