WT-2000PVN for Thin-Film
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A WT-2000PVN can be equipped with the following capabiliities for thin film solar cell measurements:
- Minority Carriers lifetime by µ-PCD
- Surface Photovoltage (SPV)
- Eddy Current (EDDY)
- Light beam induced current (LBIC)
- Junction Photovoltage (JPV)
The absorber layer can be characterized by lifetime and surface photovoltage measurements.
TCO layers can be characterized by the sheet resistance measured by eddy current technology.
Complete solar cells can be characterised by their reflectance and quantum efficiency that is measured by our LBIC technique.
Applications:
Technologies:
