WT-2000D

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The WT-2000D is a complete measurement tool for monitoring quality of silicon blocks by measuring Carrier recombination lifetime and resistivity. The system provides fast, non-contact measurements (single-point, line scans and/or maps) on silicon blocks in size up to 210x210x500mm. It has manual and automatic measurement modes and manual block loading capabilities.

Carrier recombination lifetime is a primary quality control parameter for multi-crystalline silicon blocks. The measurement is based on µ-PCD technique.

Resistivity is measured based on eddy current technique.

Applications: 

Off-line Mapping
Additional remarks: 

Software

  • Cut position determination with given limit values
  • Data output is in the form of color map
  • Easy exchange of data and images with other Windows application, e.g. word processor
  • Handling several data files at the same time
  • Data evaluation during measurement
  • Open network solutions like SECS/GEM based on TCP/IP protocol
  • Open for local or remote database servers (ODBC)
  • Open for communication like automatic or manual recording of sample ID, light sensor signal acquisition
  • Integration into factory network through OPC
Technologies: 

Lifetime