WMT

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Thickness and resistivity are primary quality control parameters for silicon wafers in PV applications. The WMT models, WMT-1 & -3, Thickness and Resistivity Testers allow measurement of wafers "on the fly", i.e., conveyor belt does not stop during measurement. Therefore, they have the high throughput that meets the requirements of in-line quality control in fully automated wafer production lines.

Applications: 

In-Line On-The-Fly
Additional remarks: 

CONFIGURATION OF A SYSTEM:

  • WMT measurement module (incl. 1 resistivity and 1-3 thickness measurement heads)
  • Industrial PC (Windows® operation system) and peripherals
  • Interface (hardware and software) to automation

Additional configurations are available if needed