SHR-1000
Printer-friendly version
SHR-1000 is a fast, non-contact and reliable alternative of four point probe in the characterization of emitter layers. Emitter sheet resistance is a primary quality control parameter for silicon cells in PV applications.
Highlights:
- Non-contact
- Preparation free
- Applicable on coated samples (phosphorous glass)
- High speed
- Production line compatible
- Alternative method to the traditional four-point-probe
- Detection of shunts
Applications:
Technologies:
