PV-2000

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PV-2000 is the world’s most powerful PV metrology system.

It is a new integrated platform with the following capabilities:

  • SPV Diffusion Length
  • Noncontact C-V
  • Accelerated LID testing
  • QSS-μPCD

Other testing capabilities:

  • SPV Surface Lifetime
  • SPV Mapping of Rshunt and Voc
  • Noncontact Suns-Voc
  • Wafer Thickness Measurement
Applications: 

Off-line Mapping
Technologies: 

Lifetime