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MCI-100

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The MCI-100  is an in-line solution for detecting microcracks in solar wafers.

Applications: 

In-Line On-The-Fly

In-Line Stop-and-Go

  • CLS
  • Wafer Surface Measurement System
  • Wafer Topology Measurement System
  • WLL
  • WLT

In-Line On-The-Fly

  • CMS
  • MCI-100
  • WML
  • WMT

Off-line Mapping

  • IRB-50
  • PV-2000
  • WT-2000D
  • WT-2000PVN

Off-line single point

  • LE-100PV
  • PN-100
  • RT-1000
  • RT-110
  • SHR-1000
  • WT-1200 & WT-1200B

Thin Film Applications

  • PT-5
  • WT-2000PVN for Thin-Film

In-line Block Mapping

  • WT-2000P

Copyright © 2009 Semilab Co. Ltd.