LE-100PV

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LE-100PV is a cost-efficient ellipsometer designed to measure antireflection coatings of silicon solar cells.

  • Silicon nitride on Si
  • Silicon oxide on Si
  • Thickness and refractive index are measured
  • Textured surfaces are measured with tilted stage
    • If only textured surfaces are measured, the price of the equipment can be reduced

 

Applications: 

Off-line single point