IRB-50

Printer-friendly versionPrinter-friendly version

This is a fast, non-contact, easy-to-use system to detect defects in silicon blocks for photovoltaic application.

Types of detectable defects:

  • Crack
  • Void
  • Inclusion
  • Growth band

Features:

  • Cut position is determined with 0.1 mm accuracy
  • Integrated motor driven rotary stage for all 4 side measurement
  • All 4 sides are measured automatically
  • Automatic evaluation software
Applications: 

Off-line Mapping
Additional remarks: 

Automatic evaluation software with block images