WT-2000MCT
Temperature Dependent Lifetime Measurements for Characterization of Narrow-Band Semiconductors
The WT-2000MCT is a special design for µ-PCD lifetime measurement at different sample temperatures.
Features and System Specifications:
- Sample size: maximum 100 mm in diameter
- Temperature range: from 80 K to 325 K
- Cooling time: < 0.2 K
Operating modes:
- Whole wafer mapping at a preselected stabilized temperature
- Single-point lifetime scan as a function of temperature
Applications:
- Minority carrier lifetime as a function of temperature
- Excels in measuring lifetime in narrow band semiconductors, where excess carriers are thermally excited at room temperature
- Materials: HgCdTe, InSb, GaAs, etc.
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