Thin Film Applications
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A strong development team of engineers and scientists have been working in Semilab to give solutions for thini film solar cell characterisation. Until now, these efforts resulted several measurement techniques integrated in two platforms.
An advanced version of WT-2000PVN holds the following options:
- Improved lifetime measurement
- Non-contact Eddy for measuring sheet resistance of ITO
- Junction PhotoVoltage for measuring sheet resistance of emitter
- Surface PhotoVoltage - to localize shunts
SE5-PV is a platform for mapping measurements on GEN-5 solar cells with the following methods:
- Spectroscopic ellipsometry measures thickness and optical properties
- Non-contact Eddy measures sheet resistance of ITO
- Haze is measured by a reflective optical head
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