We design, produce and sell metrology equipment for the characterization of semiconductor and photovoltaic materials, for monitoring the manufacturing process of semiconductor devices and solar cells, and also for R&D purposes in these areas. We offer a variety of measurement techniques; most of them are non-contact and non-destructive. Many of our technologies can be flexibly integrated in different platforms, ranging from simple handheld devices and table-top systems with high resolution mapping capability to fully automated stand-alone production control tools for mid-range and high-level fablines. We also offer in-line measurements for solar cell production lines.
Our strategy is to continuously improve our products, and to offer flexible solutions for our customers’ needs with high-value products for a reasonable price. To accomplish this, we employ more than 70 physicists and 90 engineers worldwide. We also participate in various international R&D projects, and we have a frame agreement for metrology development with IMEC, the largest international research center for the development of semiconductor products.
We carry out our work in a responsible way; we provide various benefits to our employees and support important cases such as scientific education.
Our company was founded in 1989 as a spin-off company by a team of scientists from the Research Institute for Technical Physics of the Hungarian Academy of Sciences. Historically our first product was the DLTS, and the first carrier lifetime mapper was shipped in 1991. Since that, we have expanded our portfolio with electrical and optical measurement technologies, and our company has grown substantially: we became the market leader in the area of electrical metrology for solar cell manufacturing, and the 4th biggest pure-play semiconductor metrology company with a revenue over 55 million USD in 2008. We are the 14th fastest growing technology company in Central and Eastern Europe according to Deloitte Fast 50, and the 4th in the category of companies with income over 25 million EUR. This was based on our own R&D work and acquisition of suitable firms and technologies as well.
Semitest Inc. and its technologies for dielectric metrology and epi layer testing were acquired. In 2008, assets of Sopra were bought. Sopra is the company which produced the first spectroscopic ellipsometers in the world, and also had an exclusive license covering the technique of ellipsometry-porosimetry. These products are now supplied by Semilab, and a strong R&D base using the Sopra expertise is maintained by Semilab’s French subsidiary Sopralab SAS. The well-known probe company supplying contact and non-contact methods for dielectric and implant characterization, SSM Inc. also joined the Semilab Group in 2008. In that year, QC Solutions was also acquired, with the high-frequency ac-SPV metrology for epi layers and implants. Expansion continued in 2009. Advanced Metrology Systems (AMS) joined and brought high-end technologies such as model-based infrared reflectometry for 3D structure characterization and surface acoustic wave measurements for metal and low-k layers. Semiconductor Diagnostics Inc. (SDI) also merged with Semilab, bringing the cutting-edge SPV measurements for diffusion length determination and contamination monitoring down to levels as low as 1E8 iron atoms per cubic centimeter, and also micro-sized corona charging and Kelvin probe for on-product dielectric characterization. We now have many subsidiaries, offices and representatives all around the world to develop and support all these technologies.